Jeroen Degerickx, Kristof Van Tricht, Sven Gilliams, Vlaamse Instelling Technologisch Onderzoek (VITO), Belgium; Belen Franch, Universitat de Valencia, Spain; Joost Brombacher, Henk Pelgrum, eLeaf Competence Center, Netherlands; Inbal Becker-Reshef, University of Maryland, United States; Zoltan Szantoi, European Space Agency, Italy